Elastic backscattering spectroscopic microscopy

Yang Liu, Xu Li, Young L. Kim, Vadim Backman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present elastic backscattering spectroscopic microscopy that allows simultaneous acquisition of sub-micron-resolution images and backscattering spectra at each pixel. It enables detection of highly localized scattering features within a single micro-particle and densely packed scatterers.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FiO 2005
PublisherOptical Society of America (OSA)
ISBN (Print)1557527970, 9781557527974
DOIs
StatePublished - 2005
EventFrontiers in Optics, FiO 2005 - Tucson, AZ, United States
Duration: Oct 16 2005Oct 21 2005

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherFrontiers in Optics, FiO 2005
CountryUnited States
CityTucson, AZ
Period10/16/0510/21/05

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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