@inproceedings{6d2bb4396301449aa26af90604791238,
title = "Elastic backscattering spectroscopic microscopy",
abstract = "We present elastic backscattering spectroscopic microscopy that allows simultaneous acquisition of sub-micron-resolution images and backscattering spectra at each pixel. It enables detection of highly localized scattering features within a single micro-particle and densely packed scatterers.",
author = "Yang Liu and Xu Li and Kim, \{Young L.\} and Vadim Backman",
year = "2005",
doi = "10.1364/fio.2005.ftun1",
language = "English (US)",
isbn = "1557527970",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America (OSA)",
booktitle = "Frontiers in Optics, FiO 2005",
note = "Frontiers in Optics, FiO 2005 ; Conference date: 16-10-2005 Through 21-10-2005",
}