Electrical/dielectric properties of nanocrystalline cerium oxide

Jin Ha Hwang*, Thomas O Mason, Edward J. Garboczi

*Corresponding author for this work

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.

Original languageEnglish (US)
Pages (from-to)27-32
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume457
StatePublished - Jan 1 1997

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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