Small polaron carrier density in epitaxial, doped CeO2 thin films under low oxygen partial pressure was determined from electrochemically- measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.
|Original language||English (US)|
|Number of pages||5|
|Journal||Physical Chemistry Chemical Physics|
|State||Published - 2009|
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry