Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities

William C. Chueh, Sossina M. Haile

Research output: Contribution to journalArticlepeer-review

73 Scopus citations

Abstract

Small polaron carrier density in epitaxial, doped CeO2 thin films under low oxygen partial pressure was determined from electrochemically- measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.

Original languageEnglish (US)
Pages (from-to)8144-8148
Number of pages5
JournalPhysical Chemistry Chemical Physics
Volume11
Issue number37
DOIs
StatePublished - 2009

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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