Electrochemically modulated diffraction. A novel strategy for the determination of conduction-band-edge energies for nanocrystalline thin-film semiconductor electrodes

Keyphrases

• Diffraction 100%
• Semiconductor Thin Films 100%
• Refractive Index 100%
• Conduction Band Edge 100%
• Semiconductor Electrode 100%
• Band Edge Energies 100%
• Real Component 100%
• Nanocrystalline Thin Films 100%
• Excitation Wavelength 50%
• Thin Film Electrode 50%
• Micropatterning 50%
• Optical Absorption 50%
• Band Edge 50%
• Aqueous Electrolyte 50%
• Relative Magnitude 50%
• Diffraction Efficiency 50%
• Wavelength Dependence 50%
• Trapped Electrons 50%
• Electrochemically Induced 50%
• Absorption Loss 50%
• Imaginary Component 50%
• Kramers-Kronig Analysis 50%
• Trap Site 50%
• Index Changes 50%
• Diffraction Modulation 50%
• Titanium Dioxide Thin Film 50%
• Onset Potential 50%
• Wavelength Measurement 50%
• Non-aqueous Electrolyte Solutions 50%
• Variable Excitation 50%
• Good Measures 50%

Engineering

• Edge Energy 100%
• Conduction Band Edge 100%
• Nanocrystalline 100%
• Thin Films 100%
• Refractive Index 100%
• Refractivity 100%
• Induced Change 50%
• Absorption Loss 50%
• Relative Magnitude 50%
• Band Edge 50%
• Index Change 50%
• Real Component 50%
• Absorptivity 50%
• Nonaqueous Electrolyte 50%

Material Science

• Refractive Index 100%
• Nanocrystalline 100%
• Thin Films 100%
• Electrolyte 50%
• Titanium Dioxide 50%