Electron beam induced small particle transformations: Temperature

N. Doraiswamy; L. D. Marks

doi:10.1016/0039-6028(95)01037-8

Electron beam induced small particle transformations: Temperature

N. Doraiswamy, L. D. Marks^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

37 Scopus citations

Abstract

Real time high resolution microscopy of Au, Ag and Pb particles on C and SiO substrates was performed to determine the role of the electron beam on the morphology transformations. The data conclusively rule out high temperature excursions in the small particles due to the beam.

Original language	English (US)
Pages (from-to)	L67-L69
Journal	Surface Science
Volume	348
Issue number	1-2
DOIs	https://doi.org/10.1016/0039-6028(95)01037-8
State	Published - Mar 1 1996

Keywords

Electron microscopy
Electron-solid interactions

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0039-6028(95)01037-8

Cite this

@article{99a9d0fda5f347f0be8146b5b3b409be,

title = "Electron beam induced small particle transformations: Temperature",

abstract = "Real time high resolution microscopy of Au, Ag and Pb particles on C and SiO substrates was performed to determine the role of the electron beam on the morphology transformations. The data conclusively rule out high temperature excursions in the small particles due to the beam.",

keywords = "Electron microscopy, Electron-solid interactions",

author = "N. Doraiswamy and Marks, {L. D.}",

note = "Funding Information: We gratefully acknowledge the support of the NSF under grant number DMR-9214505.",

year = "1996",

month = mar,

day = "1",

doi = "10.1016/0039-6028(95)01037-8",

language = "English (US)",

volume = "348",

pages = "L67--L69",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Electron beam induced small particle transformations

T2 - Temperature

AU - Doraiswamy, N.

AU - Marks, L. D.

N1 - Funding Information: We gratefully acknowledge the support of the NSF under grant number DMR-9214505.

PY - 1996/3/1

Y1 - 1996/3/1

N2 - Real time high resolution microscopy of Au, Ag and Pb particles on C and SiO substrates was performed to determine the role of the electron beam on the morphology transformations. The data conclusively rule out high temperature excursions in the small particles due to the beam.

AB - Real time high resolution microscopy of Au, Ag and Pb particles on C and SiO substrates was performed to determine the role of the electron beam on the morphology transformations. The data conclusively rule out high temperature excursions in the small particles due to the beam.

KW - Electron microscopy

KW - Electron-solid interactions

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UR - http://www.scopus.com/inward/citedby.url?scp=0030105944&partnerID=8YFLogxK

U2 - 10.1016/0039-6028(95)01037-8

DO - 10.1016/0039-6028(95)01037-8

M3 - Article

AN - SCOPUS:0030105944

SN - 0039-6028

VL - 348

SP - L67-L69

JO - Surface Science

JF - Surface Science

IS - 1-2

ER -

Electron beam induced small particle transformations: Temperature

Abstract

Keywords

ASJC Scopus subject areas

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