Electron beam induced small particle transformations: Temperature

N. Doraiswamy, L. D. Marks*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

Real time high resolution microscopy of Au, Ag and Pb particles on C and SiO substrates was performed to determine the role of the electron beam on the morphology transformations. The data conclusively rule out high temperature excursions in the small particles due to the beam.

Original languageEnglish (US)
Pages (from-to)L67-L69
JournalSurface Science
Volume348
Issue number1-2
DOIs
StatePublished - Mar 1 1996

Keywords

  • Electron microscopy
  • Electron-solid interactions

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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