Electron crystallography in surface structure analysis

C. Leslie; E. Landree; C. Collazo-Davila; E. Bengu; D. Grozea; L. D. Marks

doi:10.1002/(sici)1097-0029(19990801)46:3<160::aid-jemt2>3.0.co;2-%23

Electron crystallography in surface structure analysis

C. Leslie, E. Landree, C. Collazo-Davila, E. Bengu, D. Grozea, L. D. Marks^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Surface structure analysis is an important area of research, and in recent years notable advances have been made in this field, both in improved techniques for studying surfaces and in methods of analyzing them. This review aims to summarize the techniques available, particularly those relating to electron microscopy, and also to outline one of the newest areas of development, the application of direct methods to surface structure analysis.

Original language	English (US)
Pages (from-to)	160-177
Number of pages	18
Journal	Microscopy Research and Technique
Volume	46
Issue number	3
DOIs	https://doi.org/10.1002/(sici)1097-0029(19990801)46:3<160::aid-jemt2>3.0.co;2-%23
State	Published - Aug 1 1999

Keywords

Direct methods
Low energy electron diffraction (LEED)
Maximum Entropy
Minimum Relative Entropy
Photoelectron holography (PEH)
Reflection high energy electron diffraction (RHEED)
Surface structure
Transmission electron diffraction (TED)
Transmission electron microscopy (TEM)

ASJC Scopus subject areas

Anatomy
Histology
Instrumentation
Medical Laboratory Technology

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AU - Bengu, E.

AU - Grozea, D.

AU - Marks, L. D.

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KW - Minimum Relative Entropy

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KW - Transmission electron microscopy (TEM)

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