Electron crystallography in surface structure analysis

C. Leslie, E. Landree, C. Collazo-Davila, E. Bengu, D. Grozea, L. D. Marks*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Surface structure analysis is an important area of research, and in recent years notable advances have been made in this field, both in improved techniques for studying surfaces and in methods of analyzing them. This review aims to summarize the techniques available, particularly those relating to electron microscopy, and also to outline one of the newest areas of development, the application of direct methods to surface structure analysis.

Original languageEnglish (US)
Pages (from-to)160-177
Number of pages18
JournalMicroscopy Research and Technique
Volume46
Issue number3
DOIs
StatePublished - Aug 1 1999

Keywords

  • Direct methods
  • Low energy electron diffraction (LEED)
  • Maximum Entropy
  • Minimum Relative Entropy
  • Photoelectron holography (PEH)
  • Reflection high energy electron diffraction (RHEED)
  • Surface structure
  • Transmission electron diffraction (TED)
  • Transmission electron microscopy (TEM)

ASJC Scopus subject areas

  • Anatomy
  • Histology
  • Instrumentation
  • Medical Laboratory Technology

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