Abstract
Surface structure analysis is an important area of research, and in recent years notable advances have been made in this field, both in improved techniques for studying surfaces and in methods of analyzing them. This review aims to summarize the techniques available, particularly those relating to electron microscopy, and also to outline one of the newest areas of development, the application of direct methods to surface structure analysis.
Original language | English (US) |
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Pages (from-to) | 160-177 |
Number of pages | 18 |
Journal | Microscopy Research and Technique |
Volume | 46 |
Issue number | 3 |
DOIs | |
State | Published - Aug 1 1999 |
Keywords
- Direct methods
- Low energy electron diffraction (LEED)
- Maximum Entropy
- Minimum Relative Entropy
- Photoelectron holography (PEH)
- Reflection high energy electron diffraction (RHEED)
- Surface structure
- Transmission electron diffraction (TED)
- Transmission electron microscopy (TEM)
ASJC Scopus subject areas
- Anatomy
- Histology
- Instrumentation
- Medical Laboratory Technology