Electron-energy-loss x-ray absorption spectroscopy: A nonde- structive structural-depth microprobe

M. J. Bedzyk*, G. Materlik

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

A simple gas-flow proportional counter is used to measure x-ray-absorption spectra by detecting electrons emitted from a sample placed inside the counter. The sample volume is analyzed in depth, layer by layer, by detecting the emitted energy-resolved electrons. This is demonstrated for a mixed-valence SmS crystal sample oxidized in a region close to the surface.

Original languageEnglish (US)
Pages (from-to)4228-4231
Number of pages4
JournalPhysical Review B
Volume32
Issue number6
DOIs
StatePublished - 1985

ASJC Scopus subject areas

  • Condensed Matter Physics

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