Electron-energy-loss x-ray absorption spectroscopy: A nonde- structive structural-depth microprobe

M. J. Bedzyk; G. Materlik

doi:10.1103/PhysRevB.32.4228

Electron-energy-loss x-ray absorption spectroscopy: A nonde- structive structural-depth microprobe

M. J. Bedzyk^*, G. Materlik

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

A simple gas-flow proportional counter is used to measure x-ray-absorption spectra by detecting electrons emitted from a sample placed inside the counter. The sample volume is analyzed in depth, layer by layer, by detecting the emitted energy-resolved electrons. This is demonstrated for a mixed-valence SmS crystal sample oxidized in a region close to the surface.

Original language	English (US)
Pages (from-to)	4228-4231
Number of pages	4
Journal	Physical Review B
Volume	32
Issue number	6
DOIs	https://doi.org/10.1103/PhysRevB.32.4228
State	Published - 1985

ASJC Scopus subject areas

Condensed Matter Physics

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10.1103/PhysRevB.32.4228

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@article{c424b896b67f4e8595b5de40dea8bd46,

title = "Electron-energy-loss x-ray absorption spectroscopy: A nonde- structive structural-depth microprobe",

abstract = "A simple gas-flow proportional counter is used to measure x-ray-absorption spectra by detecting electrons emitted from a sample placed inside the counter. The sample volume is analyzed in depth, layer by layer, by detecting the emitted energy-resolved electrons. This is demonstrated for a mixed-valence SmS crystal sample oxidized in a region close to the surface.",

author = "Bedzyk, {M. J.} and G. Materlik",

year = "1985",

doi = "10.1103/PhysRevB.32.4228",

language = "English (US)",

volume = "32",

pages = "4228--4231",

journal = "Physical Review B",

issn = "0163-1829",

publisher = "American Institute of Physics",

number = "6",

}

TY - JOUR

T1 - Electron-energy-loss x-ray absorption spectroscopy

T2 - A nonde- structive structural-depth microprobe

AU - Bedzyk, M. J.

AU - Materlik, G.

PY - 1985

Y1 - 1985

N2 - A simple gas-flow proportional counter is used to measure x-ray-absorption spectra by detecting electrons emitted from a sample placed inside the counter. The sample volume is analyzed in depth, layer by layer, by detecting the emitted energy-resolved electrons. This is demonstrated for a mixed-valence SmS crystal sample oxidized in a region close to the surface.

AB - A simple gas-flow proportional counter is used to measure x-ray-absorption spectra by detecting electrons emitted from a sample placed inside the counter. The sample volume is analyzed in depth, layer by layer, by detecting the emitted energy-resolved electrons. This is demonstrated for a mixed-valence SmS crystal sample oxidized in a region close to the surface.

UR - http://www.scopus.com/inward/record.url?scp=0347849102&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0347849102&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.32.4228

DO - 10.1103/PhysRevB.32.4228

M3 - Article

AN - SCOPUS:0347849102

SN - 0163-1829

VL - 32

SP - 4228

EP - 4231

JO - Physical Review B

JF - Physical Review B

IS - 6

ER -

Electron-energy-loss x-ray absorption spectroscopy: A nonde- structive structural-depth microprobe

Abstract

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