TY - GEN
T1 - Electron multi-injector
T2 - 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
AU - Bianconi, Simone
AU - Mohseni, Hooman
PY - 2019/6
Y1 - 2019/6
N2 - The ultimate limit of the sensitivity of a photodetector can be expressed by its normalized detectivity as [1]: D∗ = λ\hc \sqrt{Ao\Ae eta \sqrt{1\2 (G+R)t} where for a given optimized detector material and thickness, the ratio of optical to electronic area of the detector, Ao/Ae, is a crucial parameter for the detector performance. By leveraging the degree of freedom intrinsic to this ratio, Electron Injector (EI) technology has proven capable of surpassing the current performance of commercial short-wave infrared (SWIR) cameras [2]. Unlike conventional photon detectors and imagers, which are based on planar sensing elements made of a stack of semiconductors, EI uses low-dimensional charge confinement in a 3D structure to achieve highly sensitive photon detection.
AB - The ultimate limit of the sensitivity of a photodetector can be expressed by its normalized detectivity as [1]: D∗ = λ\hc \sqrt{Ao\Ae eta \sqrt{1\2 (G+R)t} where for a given optimized detector material and thickness, the ratio of optical to electronic area of the detector, Ao/Ae, is a crucial parameter for the detector performance. By leveraging the degree of freedom intrinsic to this ratio, Electron Injector (EI) technology has proven capable of surpassing the current performance of commercial short-wave infrared (SWIR) cameras [2]. Unlike conventional photon detectors and imagers, which are based on planar sensing elements made of a stack of semiconductors, EI uses low-dimensional charge confinement in a 3D structure to achieve highly sensitive photon detection.
UR - http://www.scopus.com/inward/record.url?scp=85074666834&partnerID=8YFLogxK
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U2 - 10.1109/CLEOE-EQEC.2019.8872613
DO - 10.1109/CLEOE-EQEC.2019.8872613
M3 - Conference contribution
T3 - 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
BT - 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 23 June 2019 through 27 June 2019
ER -