Electron multi-injector: A strategy for improving quantum efficiency of infrared photodetectors

Simone Bianconi, Hooman Mohseni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The ultimate limit of the sensitivity of a photodetector can be expressed by its normalized detectivity as [1]: D = %&$* n'. (012-)4, where for a given optimized detector material and thickness, the ratio of optical to electronic area of the detector, A6/A8, is a crucial parameter for the detector performance. By leveraging the degree of freedom intrinsic to this ratio, Electron Injector (EI) technology has proven capable of surpassing the current performance of commercial short-wave infrared (SWIR) cameras [2]. Unlike conventional photon detectors and imagers, which are based on planar sensing elements made of a stack of semiconductors, EI uses low-dimensional charge confinement in a 3D structure to achieve highly sensitive photon detection.

Original languageEnglish (US)
Title of host publicationThe European Conference on Lasers and Electro-Optics, CLEO_Europe_2019
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
StatePublished - Jan 1 2019
EventThe European Conference on Lasers and Electro-Optics, CLEO_Europe_2019 - Munich, Germany
Duration: Jun 23 2019Jun 27 2019

Publication series

NameOptics InfoBase Conference Papers
VolumePart F140-CLEO_Europe 2019

Conference

ConferenceThe European Conference on Lasers and Electro-Optics, CLEO_Europe_2019
CountryGermany
CityMunich
Period6/23/196/27/19

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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