This paper illustrates the power and potential for transmission electron energy loss spectroscopy (EELS) in high spatial/energy resolution analysis of charge carriers in ceramic superconductors. The transmission EELS with a cFEG TEM complements optical and soft x-ray spectroscopies with the added advantage of high spatial resolution and ability to perform local structural and chemical characterization of ceramics.
|Original language||English (US)|
|Number of pages||2|
|Journal||Proceedings - Annual Meeting, Microscopy Society of America|
|State||Published - 1993|
|Event||Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA|
Duration: Aug 1 1993 → Aug 6 1993
ASJC Scopus subject areas