Abstract
This paper illustrates the power and potential for transmission electron energy loss spectroscopy (EELS) in high spatial/energy resolution analysis of charge carriers in ceramic superconductors. The transmission EELS with a cFEG TEM complements optical and soft x-ray spectroscopies with the added advantage of high spatial resolution and ability to perform local structural and chemical characterization of ceramics.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 944-945 |
| Number of pages | 2 |
| Journal | Proceedings - Annual Meeting, Microscopy Society of America |
| State | Published - 1993 |
| Event | Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993 |
ASJC Scopus subject areas
- Engineering(all)