Electronic defects in the halide antiperovskite semiconductor Hg3Se2 I2

Joon Il Kim, John A. Peters, Yihui He, Zhifu Liu, Sanjib Das, Oleg Y. Kontsevoi, Mercouri G. Kanatzidis, Bruce W. Wessels

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Halide perovskites have emerged as a potential photoconducting material for photovoltaics and hard radiation detection. We investigate the nature of charge transport in the semi-insulating chalcohalide Hg3Se2I2 compound using the temperature dependence of dark current, thermally stimulated current (TSC) spectroscopy, and photoconductivity measurements as well as first-principles density functional theory (DFT) calculations. Dark conductivity measurements and TSC spectroscopy indicate the presence of multiple shallow and deep level traps that have relatively low concentrations of the order of 1013-1015cm-3 and capture cross sections of ∼10-16cm2. A distinct persistent photoconductivity is observed at both low temperatures (<170K) and high temperatures (>230 K), with major implications for room-temperature compound semiconductor radiation detection. From preliminary DFT calculations, the origin of the traps is attributed to intrinsic vacancy defects (VHg, VSe, and VI) and interstitials (Seint) or other extrinsic impurities. The results point the way for future improvements in crystal quality and detector performance.

Original languageEnglish (US)
Article number165201
JournalPhysical Review B
Volume96
Issue number16
DOIs
StatePublished - Oct 5 2017

Funding

This work was supported by the U.S. Department of Homeland Security ARI program under Grant No. 2014-DN-077-ARI086-01. This work made use of the Materials Processing and Microfabrication Facility supported by the MRSEC program of the National Science Foundation (DMR-1121262) at the Materials Research Center of Northwestern University.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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