Encapsulation, diffusion and diet in the electron microscope

J. Strane*, L. D. Marks, D. E. Luzzi, M. I. Buckett, J. P. Zhang, B. W. Wessels

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Scopus citations


Observations of a large number of different oxides in the electron microscope clearly indicate that a crucial role is played by the presence or absence of encapsulating layers, either amorphous carbon, graphitic carbon or damaged metallic regions produced by DIET of the oxygen, and point defect diffusion in the subsurface region. In the presence of an encapsulation layer DIET slows by a factor which is related to the point defect migration through this layer.

Original languageEnglish (US)
Pages (from-to)253-257
Number of pages5
Issue number3
StatePublished - 1988

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation


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