Encapsulation, diffusion and diet in the electron microscope

J. Strane; L. D. Marks; D. E. Luzzi; M. I. Buckett; J. P. Zhang; B. W. Wessels

doi:10.1016/0304-3991(88)90019-8

Encapsulation, diffusion and diet in the electron microscope

J. Strane^*, L. D. Marks, D. E. Luzzi, M. I. Buckett, J. P. Zhang, B. W. Wessels

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

Observations of a large number of different oxides in the electron microscope clearly indicate that a crucial role is played by the presence or absence of encapsulating layers, either amorphous carbon, graphitic carbon or damaged metallic regions produced by DIET of the oxygen, and point defect diffusion in the subsurface region. In the presence of an encapsulation layer DIET slows by a factor which is related to the point defect migration through this layer.

Original language	English (US)
Pages (from-to)	253-257
Number of pages	5
Journal	Ultramicroscopy
Volume	25
Issue number	3
DOIs	https://doi.org/10.1016/0304-3991(88)90019-8
State	Published - 1988

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/0304-3991(88)90019-8

Fingerprint Dive into the research topics of 'Encapsulation, diffusion and diet in the electron microscope'. Together they form a unique fingerprint.

Cite this

@article{ac8b912e7b3645dc9cd1624ae24e5eb9,

title = "Encapsulation, diffusion and diet in the electron microscope",

abstract = "Observations of a large number of different oxides in the electron microscope clearly indicate that a crucial role is played by the presence or absence of encapsulating layers, either amorphous carbon, graphitic carbon or damaged metallic regions produced by DIET of the oxygen, and point defect diffusion in the subsurface region. In the presence of an encapsulation layer DIET slows by a factor which is related to the point defect migration through this layer.",

author = "J. Strane and Marks, {L. D.} and Luzzi, {D. E.} and Buckett, {M. I.} and Zhang, {J. P.} and Wessels, {B. W.}",

year = "1988",

doi = "10.1016/0304-3991(88)90019-8",

language = "English (US)",

volume = "25",

pages = "253--257",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "3",

}

TY - JOUR

T1 - Encapsulation, diffusion and diet in the electron microscope

AU - Strane, J.

AU - Marks, L. D.

AU - Luzzi, D. E.

AU - Buckett, M. I.

AU - Zhang, J. P.

AU - Wessels, B. W.

PY - 1988

Y1 - 1988

N2 - Observations of a large number of different oxides in the electron microscope clearly indicate that a crucial role is played by the presence or absence of encapsulating layers, either amorphous carbon, graphitic carbon or damaged metallic regions produced by DIET of the oxygen, and point defect diffusion in the subsurface region. In the presence of an encapsulation layer DIET slows by a factor which is related to the point defect migration through this layer.

AB - Observations of a large number of different oxides in the electron microscope clearly indicate that a crucial role is played by the presence or absence of encapsulating layers, either amorphous carbon, graphitic carbon or damaged metallic regions produced by DIET of the oxygen, and point defect diffusion in the subsurface region. In the presence of an encapsulation layer DIET slows by a factor which is related to the point defect migration through this layer.

UR - http://www.scopus.com/inward/record.url?scp=0023865773&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023865773&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(88)90019-8

DO - 10.1016/0304-3991(88)90019-8

M3 - Article

AN - SCOPUS:0023865773

VL - 25

SP - 253

EP - 257

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 3

ER -