Energy variation in diffusive void nucleation induced by electromigration

Yuexing Wang, Yao Yao*, Zhang Long, Leon Keer

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Abstract: An energy approach is proposed to describe electromigration induced void nucleation based on phase transformation theory. The chemical potential for an individual migrated atom is predicted by diffusion induced back stress equivalent principle. After determining the chemical potential for the diffusing atoms, the Gibbs free energy controlling the void nucleation can be determined and the mass diffusion process is considered. The critical void radius and nucleation time are determined analytically when the Gibbs free energy approaches the extreme value. The theoretical predictions are compared with the experimental results from literatures and show good accuracy. The proposed model can also be applied to other diffusion induced damage processes such as thermomigration and stress migration. Graphic abstract: [Figure not available: see fulltext.].

Original languageEnglish (US)
Pages (from-to)866-872
Number of pages7
JournalActa Mechanica Sinica/Lixue Xuebao
Volume36
Issue number4
DOIs
StatePublished - Aug 1 2020

Keywords

  • Diffusion
  • Electromigration
  • Energy
  • Void nucleation

ASJC Scopus subject areas

  • Computational Mechanics
  • Mechanical Engineering

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