Enhanced magnetoresistance below the spin-flip transition of Cr(001) thin films

J. E. Mattson; S. D. Bader; M. B. Brodsky; J. B. Ketterson

doi:10.1016/0304-8853(92)91747-H

Enhanced magnetoresistance below the spin-flip transition of Cr(001) thin films

J. E. Mattson^*, S. D. Bader, M. B. Brodsky, J. B. Ketterson

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Magnetoresistance measurements are used to identify the spin-flip transition temperature T_sf in 500 and 3000 Å thick Cr(001) films grown epitaxially on LiF(001). T_sf is suppressed to a lower temperature in the 500 Å film compared to the bulk value of 123 K. The shift in T_sf with film thickness follows a similar stress dependence as that reported previously for bulk Cr crystals. The magnetoresistance is 50% at 4.2 K in a field of 5 T and still shows no sign of approaching saturation.

Original language	English (US)
Pages (from-to)	179-184
Number of pages	6
Journal	Journal of Magnetism and Magnetic Materials
Volume	109
Issue number	2-3
DOIs	https://doi.org/10.1016/0304-8853(92)91747-H
State	Published - Mar 1992

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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title = "Enhanced magnetoresistance below the spin-flip transition of Cr(001) thin films",

abstract = "Magnetoresistance measurements are used to identify the spin-flip transition temperature Tsf in 500 and 3000 {\AA} thick Cr(001) films grown epitaxially on LiF(001). Tsf is suppressed to a lower temperature in the 500 {\AA} film compared to the bulk value of 123 K. The shift in Tsf with film thickness follows a similar stress dependence as that reported previously for bulk Cr crystals. The magnetoresistance is 50% at 4.2 K in a field of 5 T and still shows no sign of approaching saturation.",

author = "Mattson, {J. E.} and Bader, {S. D.} and Brodsky, {M. B.} and Ketterson, {J. B.}",

year = "1992",

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T1 - Enhanced magnetoresistance below the spin-flip transition of Cr(001) thin films

AU - Mattson, J. E.

AU - Bader, S. D.

AU - Brodsky, M. B.

AU - Ketterson, J. B.

PY - 1992/3

Y1 - 1992/3

N2 - Magnetoresistance measurements are used to identify the spin-flip transition temperature Tsf in 500 and 3000 Å thick Cr(001) films grown epitaxially on LiF(001). Tsf is suppressed to a lower temperature in the 500 Å film compared to the bulk value of 123 K. The shift in Tsf with film thickness follows a similar stress dependence as that reported previously for bulk Cr crystals. The magnetoresistance is 50% at 4.2 K in a field of 5 T and still shows no sign of approaching saturation.

AB - Magnetoresistance measurements are used to identify the spin-flip transition temperature Tsf in 500 and 3000 Å thick Cr(001) films grown epitaxially on LiF(001). Tsf is suppressed to a lower temperature in the 500 Å film compared to the bulk value of 123 K. The shift in Tsf with film thickness follows a similar stress dependence as that reported previously for bulk Cr crystals. The magnetoresistance is 50% at 4.2 K in a field of 5 T and still shows no sign of approaching saturation.

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EP - 184

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

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