Magnetoresistance measurements are used to identify the spin-flip transition temperature Tsf in 500 and 3000 Å thick Cr(001) films grown epitaxially on LiF(001). Tsf is suppressed to a lower temperature in the 500 Å film compared to the bulk value of 123 K. The shift in Tsf with film thickness follows a similar stress dependence as that reported previously for bulk Cr crystals. The magnetoresistance is 50% at 4.2 K in a field of 5 T and still shows no sign of approaching saturation.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics