Abstract
Magnetoresistance measurements are used to identify the spin-flip transition temperature Tsf in 500 and 3000 Å thick Cr(001) films grown epitaxially on LiF(001). Tsf is suppressed to a lower temperature in the 500 Å film compared to the bulk value of 123 K. The shift in Tsf with film thickness follows a similar stress dependence as that reported previously for bulk Cr crystals. The magnetoresistance is 50% at 4.2 K in a field of 5 T and still shows no sign of approaching saturation.
Original language | English (US) |
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Pages (from-to) | 179-184 |
Number of pages | 6 |
Journal | Journal of Magnetism and Magnetic Materials |
Volume | 109 |
Issue number | 2-3 |
DOIs | |
State | Published - Mar 1992 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics