Enhanced magnetoresistance below the spin-flip transition of Cr(001) thin films

J. E. Mattson*, S. D. Bader, M. B. Brodsky, J. B. Ketterson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


Magnetoresistance measurements are used to identify the spin-flip transition temperature Tsf in 500 and 3000 Å thick Cr(001) films grown epitaxially on LiF(001). Tsf is suppressed to a lower temperature in the 500 Å film compared to the bulk value of 123 K. The shift in Tsf with film thickness follows a similar stress dependence as that reported previously for bulk Cr crystals. The magnetoresistance is 50% at 4.2 K in a field of 5 T and still shows no sign of approaching saturation.

Original languageEnglish (US)
Pages (from-to)179-184
Number of pages6
JournalJournal of Magnetism and Magnetic Materials
Issue number2-3
StatePublished - Mar 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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