Epitaxial stabilization of ultra-thin films of EuNiO3

D. Meyers, E. J. Moon, M. Kareev, I. C. Tung, B. A. Gray, Jian Liu, Michael J Bedzyk, J. W. Freeland, J. Chakhalian

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

We report on the synthesis of ultra-thin films of highly distorted EuNiO3 (ENO) grown by interrupted pulse laser epitaxy on YAlO 3 perovskite (YAP) substrates. Samples were then investigated with reflection high energy electron diffraction, atomic force microscopy, x-ray diffraction, reciprocal space mapping, and x-ray absorption spectroscopy. Combined, the measurements revealed the samples exhibited high structural and electronic quality that is of critical importance to the observed electronic and magnetic properties of the rare-earth nickelates. Growth of ultra-thin films of this highly distorted nickelate system in precisely controlled environments provides the ability to thoroughly investigate electronic phases with decoupled metal-to-insulator/charge-order and anti-ferromagnetic transitions.

Original languageEnglish (US)
Article number385303
JournalJournal of Physics D: Applied Physics
Volume46
Issue number38
DOIs
StatePublished - Sep 25 2013

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

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