Erratum: Displacement detection of silicon nanowires by polarization-enhanced fiber-optic interferometry (Applied Physics Letters (2008) 93 (193110))

John M. Nichol, Eric R. Hemesath, Lincoln J. Lauhon, Raffi Budakian

Research output: Contribution to journalComment/debatepeer-review

Original languageEnglish (US)
Article number239901
JournalApplied Physics Letters
Issue number23
StatePublished - 2009

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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