Error probability and near-far resistance of minimum mean squared error interference suppression schemes for CDMA

Upamanyu Madhow, Michael L Honig

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Scopus citations

Abstract

We consider interference suppression schemes for Direct Sequence Spread-Spectrum (DS/SS) Code Division Multiple Access (CDMA) systems using the Minimum Mean Squared Error (MMSE) criterion. When compared to other interference suppression schemes, such as maximum-likelihood decoding, this criterion has the advantage of being amenable to adaptive implementations that do not require knowledge of the interference parameters, such as their relative strengths and spreading sequences. These schemes are shown to be near-far resistant to varying degrees, depending on their complexity. That is, the error probability remains relatively low no matter how strong the interference. Numerical results showing error probability vs. interference power demonstrate that the proposed schemes offer substantial performance gains relative to the matched filter receiver.

Original languageEnglish (US)
Title of host publicationGLOBECOM 1992 - Communication for Global Users
Subtitle of host publicationIEEE Global Telecommunications Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1339-1343
Number of pages5
ISBN (Electronic)0780306082, 9780780306080
DOIs
StatePublished - Jan 1 1992
Event1992 IEEE Global Telecommunications Conference: Communication for Global Users, GLOBECOM 1992 - Orlando, United States
Duration: Dec 6 1992Dec 9 1992

Publication series

NameGLOBECOM 1992 - Communication for Global Users: IEEE Global Telecommunications Conference

Conference

Conference1992 IEEE Global Telecommunications Conference: Communication for Global Users, GLOBECOM 1992
CountryUnited States
CityOrlando
Period12/6/9212/9/92

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Information Systems
  • Information Systems and Management
  • Safety, Risk, Reliability and Quality

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