Evaluation of defects in cuprous oxide through exciton luminescence imaging

Laszlo Frazer*, Erik J. Lenferink, Kelvin B. Chang, Kenneth R. Poeppelmeier, Nathaniel P. Stern, John B. Ketterson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

The various decay mechanisms of excitons in cuprous oxide (Cu2O) are highly sensitive to defects which can relax selection rules. Here we report cryogenic hyperspectral imaging of exciton luminescence from cuprous oxide crystals grown via the floating zone method showing that the samples have few defects. Some locations, however, show strain splitting of the 1s orthoexciton triplet polariton luminescence. Strain is reduced by annealing. In addition, annealing causes annihilation of oxygen and copper vacancies, which leads to a negative correlation between luminescence of unlike vacancies.

Original languageEnglish (US)
Pages (from-to)294-302
Number of pages9
JournalJournal of Luminescence
Volume159
DOIs
StatePublished - Mar 2015

Keywords

  • CuO
  • Cuprous oxide
  • Excitons
  • Hyperspectral imaging
  • Stress
  • Vacancies

ASJC Scopus subject areas

  • Biophysics
  • Biochemistry
  • Chemistry(all)
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Evaluation of defects in cuprous oxide through exciton luminescence imaging'. Together they form a unique fingerprint.

Cite this