EXAFS studies on the structure of photoexcited cyclopentadienylnickelnitrosyl(C5H5-NiNO)

Lin X. Chen*, Michael K. Bowman, Pedro A. Montano, James R. Norris

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

The structures of C5H5NiNO in a reversible photochemical reaction were studied via EXAFS, FTIR, and optical absorption spectroscopies. A photoexcited intermediate with distinctively different EXAFS, IR, and optical absorption spectra from those of the ground state molecules was generated upon irradiation using 365 nm light at 20K in a 3-methylpentane solution. The reverse reaction was induced by irradiation with 310 nm light. The EXAFS data analysis has shown a 0.12A elongation of the Ni-N bond and the bending of Ni-N-O in the photoexcited intermediate. Several ZINDO calculations were conducted based on the structures obtained from the EXAFS spectroscopy. These calculations reproduced the changes in the optical spectra and the intramolecular electron transfer in C5H5NiNO.

Original languageEnglish (US)
Title of host publicationApplications of Synchrotron Radiation Techniques to Materials Science
PublisherPubl by Materials Research Society
Pages45-50
Number of pages6
ISBN (Print)1558992030, 9781558992030
DOIs
StatePublished - 1993
EventMaterials Research Society Spring Meeting - San Francisco, CA, USA
Duration: Apr 12 1993Apr 15 1993

Publication series

NameMaterials Research Society Symposium Proceedings
Volume307
ISSN (Print)0272-9172

Other

OtherMaterials Research Society Spring Meeting
CitySan Francisco, CA, USA
Period4/12/934/15/93

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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