Experimental Importance Sampling Using a 3-Section PMD Emulator with Programmable DGD Elements

L. S. Yan*, M. Hauer, A. E. Willner, Y. Shi, X. Yao, W. L. Kath

*Corresponding author for this work

Research output: Contribution to conferencePaper

6 Scopus citations

Abstract

We experimentally employ importance sampling techniques using three programmable DGD elements to obtain rare PMD events with probabilities as low as 10 -24 with only 1000 random samples. Our method does not require deterministic control of the polarization coupling between sections.

Original languageEnglish (US)
Pages421-422
Number of pages2
StatePublished - Dec 1 2003

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Yan, L. S., Hauer, M., Willner, A. E., Shi, Y., Yao, X., & Kath, W. L. (2003). Experimental Importance Sampling Using a 3-Section PMD Emulator with Programmable DGD Elements. 421-422.