Experimental limitations in impedance spectroscopy of materials systems

G. Hsieh*, D. D. Edwards, S. J. Ford, J. H. Hwang, J. Shane, E. J. Garboczi, Thomas O Mason

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.

Original languageEnglish (US)
Pages (from-to)3-12
Number of pages10
JournalMaterials Research Society Symposium - Proceedings
Volume411
StatePublished - Jan 1 1996

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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