Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.
|Original language||English (US)|
|Number of pages||10|
|Journal||Materials Research Society Symposium - Proceedings|
|State||Published - Jan 1 1996|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials