Experimental limitations in impedance spectroscopy: Part V. Apparatus contributions and corrections

D. D. Edwards, J. H. Hwang, S. J. Ford, T. O. Mason*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

58 Scopus citations

Abstract

Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.

Original languageEnglish (US)
Pages (from-to)85-93
Number of pages9
JournalSolid State Ionics
Volume99
Issue number1-2
DOIs
StatePublished - Aug 1 1997

Funding

This work was supported by the U.S. Department of Energy under grant no. FG02-84-ER45097 (JHH, TOM) and the National Science Foundation under Materials Research Science and Engineering Centres grant no. DMR-91-20521 (DE, TOM) and under Science and Technology Centres grant no. DMR-91-20002 (SJF, TOM). The authors are grateful to Dr. William Hammetter of Sandia National Labs for helpful discussions.

Keywords

  • Apparatus
  • Impedance spectroscopy
  • Simulation

ASJC Scopus subject areas

  • General Chemistry
  • General Materials Science
  • Condensed Matter Physics

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