Abstract
Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.
Original language | English (US) |
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Pages (from-to) | 85-93 |
Number of pages | 9 |
Journal | Solid State Ionics |
Volume | 99 |
Issue number | 1-2 |
DOIs | |
State | Published - Aug 1 1997 |
Funding
This work was supported by the U.S. Department of Energy under grant no. FG02-84-ER45097 (JHH, TOM) and the National Science Foundation under Materials Research Science and Engineering Centres grant no. DMR-91-20521 (DE, TOM) and under Science and Technology Centres grant no. DMR-91-20002 (SJF, TOM). The authors are grateful to Dr. William Hammetter of Sandia National Labs for helpful discussions.
Keywords
- Apparatus
- Impedance spectroscopy
- Simulation
ASJC Scopus subject areas
- General Chemistry
- General Materials Science
- Condensed Matter Physics