Experimental limitations in impedance spectroscopy: Part V. Apparatus contributions and corrections

D. D. Edwards, J. H. Hwang, S. J. Ford, T. O. Mason*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

54 Scopus citations

Abstract

Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.

Original languageEnglish (US)
Pages (from-to)85-93
Number of pages9
JournalSolid State Ionics
Volume99
Issue number1-2
DOIs
StatePublished - Aug 1 1997

Keywords

  • Apparatus
  • Impedance spectroscopy
  • Simulation

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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