Experimental limitations in impedance spectroscopy: Part VI. Four-point measurements of solid materials systems

G. Hsieh, S. J. Ford, T. O. Mason*, L. R. Pederson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

Four-point impedance spectroscopy of solid materials systems is severely hampered by unavoidable voltage-divider effects associated with the reference electrodes. As demonstrated by test circuit studies and experiments with Pt/YSZ/Pt cells (with embedded silver reference electrodes), high impedance reference electrodes can produce distorted and erroneous impedance data. The relationships between these data and the sample properties (conductivity, dielectric constant) and instrument limitations (input impedance/capacitance) are derived. Successful four-point impedance measurements on conductive systems require large effective dielectric constants, which may be unattainable in bulk solids, but are often associated with internal interfaces.

Original languageEnglish (US)
Pages (from-to)297-311
Number of pages15
JournalSolid State Ionics
Volume100
Issue number3-4
DOIs
StatePublished - Oct 1997

Keywords

  • Four-point measurements
  • Impedance spectroscopy

ASJC Scopus subject areas

  • General Chemistry
  • General Materials Science
  • Condensed Matter Physics

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