Extended depth-of-field microscopy with a high-speed deformable mirror

William J. Shain*, Nicholas A. Vickers, Bennett B. Goldberg, Thomas Bifano, Jerome Mertz

*Corresponding author for this work

Research output: Contribution to journalArticle

34 Scopus citations

Abstract

We present a wide-field fluorescence microscopy add-on that provides a fast, light-efficient extended depth-of-field (EDOF) using a deformable mirror with an update rate of 20 kHz. Out-of-focus contributions in the raw EDOF images are suppressed with a deconvolution algorithm derived directly from the microscope 3D optical transfer function. Demonstrations of the benefits of EDOF microscopy are shown with GCaMP-labeled mouse brain tissue.

Original languageEnglish (US)
Pages (from-to)995-998
Number of pages4
JournalOptics Letters
Volume42
Issue number5
DOIs
StatePublished - Mar 1 2017

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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