Original language | English (US) |
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Pages (from-to) | 363-364 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 30 |
Issue number | 2024 |
DOIs | |
State | Published - Jul 24 2024 |
Event | 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024 |
Funding
This material is based upon work supported by the U.S. Department of Energy, Office of Science under Award Number DE-SC0022413. Work performed at the Center for Nanoscale Materials, a U.S. Department of Energy Office of Science User Facility, was supported by the U.S. DOE, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. M.K.Y.C. acknowledges the support from the BES SUFD Early Career award. This was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor any agency thereof, nor any of their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The views and opinions of authors expressed do not necessarily state or reflect those of the United States Government or any agency thereof.
ASJC Scopus subject areas
- Instrumentation