Extracting grain orientations from EBSD patterns of polycrystalline materials using convolutional neural networks

Dipendra Jha, Saransh Singh, Reda Al-Bahrani, Wei Keng Liao, Alok Choudhary, Marc De Graef, Ankit Agrawal*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

We present a deep learning approach to the indexing of electron backscatter diffraction (EBSD) patterns. We design and implement a deep convolutional neural network architecture to predict crystal orientation from the EBSD patterns. We design a differentiable approximation to the disorientation function between the predicted crystal orientation and the ground truth; the deep learning model optimizes for the mean disorientation error between the predicted crystal orientation and the ground truth using stochastic gradient descent. The deep learning model is trained using 374,852 EBSD patterns of polycrystalline nickel from simulation and evaluated using 1,000 experimental EBSD patterns of polycrystalline nickel. The deep learning model results in a mean disorientation error of 0.548° compared to 0.652° using dictionary based indexing.

Original languageEnglish (US)
Pages (from-to)497-502
Number of pages6
JournalMicroscopy and Microanalysis
Volume24
Issue number5
DOIs
StatePublished - Oct 1 2018

Keywords

  • EBSD
  • convolutional neural networks
  • deep learning
  • electron backscatter diffraction

ASJC Scopus subject areas

  • Instrumentation

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