TY - JOUR
T1 - Extraction of accurate structure-factor amplitudes from Laue data
T2 - Wavelength normalization with wiggler and undulator X-ray sources
AU - Šrajer, Vukica
AU - Crosson, Sean
AU - Schmidt, Marius
AU - Key, Jason
AU - Schotte, Friedrich
AU - Anderson, Spencer
AU - Perman, Benjamin
AU - Ren, Zhong
AU - Teng, T. Y.
AU - Bourgeois, Dominique
AU - Wulff, Michael
AU - Moffat, Keith
PY - 2000/7/1
Y1 - 2000/7/1
N2 - Wavelength normalization is an essential part of processing of Laue X-ray diffraction data and is critically important for deriving accurate structure-factor amplitudes. The results of wavelength normalization for Laue data obtained in nanosecond time-resolved experiments at the ID09 beamline at the European Synchrotron Radiation Facility, Grenoble, France, are presented. Several wiggler and undulator insertion devices with complex spectra were used. The results show that even in the most challenging cases, such as wiggler/undulator tandems or single-line undulators, accurate wavelength normalization does not require unusually redundant Laue data and can be accomplished using typical Laue data sets. Single-line undulator spectra derived from Laue data compare well with the measured incident X-ray spectra. Successful wavelength normalization of the undulator data was also confirmed by the observed signal in nanosecond time-resolved experiments. Single-line undulators, which are attractive for time-resolved experiments due to their high peak intensity and low polychromatic background, are compared with wigglers, based on data obtained on the same crystal.
AB - Wavelength normalization is an essential part of processing of Laue X-ray diffraction data and is critically important for deriving accurate structure-factor amplitudes. The results of wavelength normalization for Laue data obtained in nanosecond time-resolved experiments at the ID09 beamline at the European Synchrotron Radiation Facility, Grenoble, France, are presented. Several wiggler and undulator insertion devices with complex spectra were used. The results show that even in the most challenging cases, such as wiggler/undulator tandems or single-line undulators, accurate wavelength normalization does not require unusually redundant Laue data and can be accomplished using typical Laue data sets. Single-line undulator spectra derived from Laue data compare well with the measured incident X-ray spectra. Successful wavelength normalization of the undulator data was also confirmed by the observed signal in nanosecond time-resolved experiments. Single-line undulators, which are attractive for time-resolved experiments due to their high peak intensity and low polychromatic background, are compared with wigglers, based on data obtained on the same crystal.
KW - Insertion devices
KW - Laue x-ray diffraction
KW - Wavelength normalization
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U2 - 10.1107/S0909049500004672
DO - 10.1107/S0909049500004672
M3 - Article
C2 - 16609201
AN - SCOPUS:19244377761
SN - 0909-0495
VL - 7
SP - 236
EP - 244
JO - Journal of Synchrotron Radiation
JF - Journal of Synchrotron Radiation
IS - 4
ER -