Extraction of accurate structure-factor amplitudes from Laue data: Wavelength normalization with wiggler and undulator X-ray sources

Vukica Šrajer*, Sean Crosson, Marius Schmidt, Jason Key, Friedrich Schotte, Spencer Anderson, Benjamin Perman, Zhong Ren, T. Y. Teng, Dominique Bourgeois, Michael Wulff, Keith Moffat

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    26 Scopus citations

    Abstract

    Wavelength normalization is an essential part of processing of Laue X-ray diffraction data and is critically important for deriving accurate structure-factor amplitudes. The results of wavelength normalization for Laue data obtained in nanosecond time-resolved experiments at the ID09 beamline at the European Synchrotron Radiation Facility, Grenoble, France, are presented. Several wiggler and undulator insertion devices with complex spectra were used. The results show that even in the most challenging cases, such as wiggler/undulator tandems or single-line undulators, accurate wavelength normalization does not require unusually redundant Laue data and can be accomplished using typical Laue data sets. Single-line undulator spectra derived from Laue data compare well with the measured incident X-ray spectra. Successful wavelength normalization of the undulator data was also confirmed by the observed signal in nanosecond time-resolved experiments. Single-line undulators, which are attractive for time-resolved experiments due to their high peak intensity and low polychromatic background, are compared with wigglers, based on data obtained on the same crystal.

    Original languageEnglish (US)
    Pages (from-to)236-244
    Number of pages9
    JournalJournal of Synchrotron Radiation
    Volume7
    Issue number4
    DOIs
    StatePublished - Jul 1 2000

    Keywords

    • Insertion devices
    • Laue x-ray diffraction
    • Wavelength normalization

    ASJC Scopus subject areas

    • Radiation
    • Nuclear and High Energy Physics
    • Instrumentation

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