Extrinsic origins of electrical transport anomalies near the superconducting transition in mesoscopic aluminum lines

B. Burk*, C. J. Chien, Venkat Chandrasekhar, C. Strunk, V. Bruyndoncx, C. Van Haesendonck, V. V. Moshchalkov, Y. Bruynseraede

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

We investigate whether inadvertent noise currents may induce the previously reported resistive peak and negative differential resistance (dV/dI) anomalies near the superconducting transition in quasi-one-dimensional aluminum lines. Although our samples show no intrinsic anomalies, low frequency current deliberately applied to the sample in addition to the ordinary measuring current induces the anomalies. In our work the resistive peak results from simple mixing, but the negative dV/dI feature arises from a more complex effect.

Original languageEnglish (US)
Pages (from-to)1549-1553
Number of pages5
JournalJournal of Applied Physics
Volume83
Issue number3
DOIs
StatePublished - Feb 1 1998

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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