Fabrication and dc characteristics of vertically stacked sis-type structures for use as low-temperature detectors

I. P. Nevirkovets*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'Fabrication and dc characteristics of vertically stacked sis-type structures for use as low-temperature detectors'. Together they form a unique fingerprint.

INIS

Engineering

Physics

Material Science