Fast scanning in x-ray microscopy: The effects of offset in the central stop position

Everett Vacek; Curt Preissner; Junjing Deng; Chris Jacobsen

doi:10.1364/AO.469319

Fast scanning in x-ray microscopy: The effects of offset in the central stop position

Everett Vacek, Curt Preissner, Junjing Deng, Chris Jacobsen^*

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

Abstract

Scanning of lightweight circular diffractive optics, separate from central stops and apertures, is emerging as an approach to exploit advances in synchrotron x-ray sources. We consider the effects in a scanning microscope of offsets between the optic and its central stop and find that scan ranges of up to about half the diameter of the optic are possible with only about a 10% increase in the focal spot width. For large scanning ranges, we present criteria for the working distance between the last aperture and the specimen to be imaged.

Original language	English (US)
Pages (from-to)	6811-6818
Number of pages	8
Journal	Applied optics
Volume	61
Issue number	23
DOIs	https://doi.org/10.1364/AO.469319
State	Published - Aug 10 2022

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.469319

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title = "Fast scanning in x-ray microscopy: The effects of offset in the central stop position",

abstract = "Scanning of lightweight circular diffractive optics, separate from central stops and apertures, is emerging as an approach to exploit advances in synchrotron x-ray sources. We consider the effects in a scanning microscope of offsets between the optic and its central stop and find that scan ranges of up to about half the diameter of the optic are possible with only about a 10% increase in the focal spot width. For large scanning ranges, we present criteria for the working distance between the last aperture and the specimen to be imaged.",

author = "Everett Vacek and Curt Preissner and Junjing Deng and Chris Jacobsen",

note = "Funding Information: Basic Energy Sciences (DE-AC02-06CH11357); National Institute of General Medical Sciences (R01 GM104530). This research used resources of the Advanced Photon Source, which is a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory. We thank the National Institute of General Medical Services, National Institutes of Health, for support. Publisher Copyright: {\textcopyright} 2022 Optica Publishing Group.",

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AU - Deng, Junjing

AU - Jacobsen, Chris

N1 - Funding Information: Basic Energy Sciences (DE-AC02-06CH11357); National Institute of General Medical Sciences (R01 GM104530). This research used resources of the Advanced Photon Source, which is a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory. We thank the National Institute of General Medical Services, National Institutes of Health, for support. Publisher Copyright: © 2022 Optica Publishing Group.

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Y1 - 2022/8/10

N2 - Scanning of lightweight circular diffractive optics, separate from central stops and apertures, is emerging as an approach to exploit advances in synchrotron x-ray sources. We consider the effects in a scanning microscope of offsets between the optic and its central stop and find that scan ranges of up to about half the diameter of the optic are possible with only about a 10% increase in the focal spot width. For large scanning ranges, we present criteria for the working distance between the last aperture and the specimen to be imaged.

AB - Scanning of lightweight circular diffractive optics, separate from central stops and apertures, is emerging as an approach to exploit advances in synchrotron x-ray sources. We consider the effects in a scanning microscope of offsets between the optic and its central stop and find that scan ranges of up to about half the diameter of the optic are possible with only about a 10% increase in the focal spot width. For large scanning ranges, we present criteria for the working distance between the last aperture and the specimen to be imaged.

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Fast scanning in x-ray microscopy: The effects of offset in the central stop position

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