Fast scanning in x-ray microscopy: The effects of offset in the central stop position

Everett Vacek, Curt Preissner, Junjing Deng, Chris Jacobsen*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Scanning of lightweight circular diffractive optics, separate from central stops and apertures, is emerging as an approach to exploit advances in synchrotron x-ray sources. We consider the effects in a scanning microscope of offsets between the optic and its central stop and find that scan ranges of up to about half the diameter of the optic are possible with only about a 10% increase in the focal spot width. For large scanning ranges, we present criteria for the working distance between the last aperture and the specimen to be imaged.

Original languageEnglish (US)
Pages (from-to)6811-6818
Number of pages8
JournalApplied optics
Volume61
Issue number23
DOIs
StatePublished - Aug 10 2022

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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