Fast time-resolved x-ray diffraction in BaTiO3 films subjected to a strong high-frequency electric field

E. Zolotoyabko*, J. P. Quintana, B. H. Hoerman, Bruce W Wessels

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

The pulsed synchrotron radiation from the Advanced Photon Source of Argonne National Laboratory was used to measure the dynamic structural response in 200-nm-thick BaTiO3 ferroelectric films, in situ, under the application of a high-frequency electric field. X-ray diffraction measurements were performed in the stroboscopic mode, i.e., by synchronizing the x-ray bursts with the electric-field periodicity. Time-dependent variations of lattice parameters were derived from the electric-field-induced distortions of the diffraction profiles. Drastic reduction of the relaxation time, from 6.9 ns at 71.69 MHz down to 0.7 ns at 521.36 MHz, was found with an increase of the electric-field frequency.

Original languageEnglish (US)
Pages (from-to)3159-3161
Number of pages3
JournalApplied Physics Letters
Volume80
Issue number17
DOIs
StatePublished - Apr 29 2002

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Fast time-resolved x-ray diffraction in BaTiO<sub>3</sub> films subjected to a strong high-frequency electric field'. Together they form a unique fingerprint.

Cite this