Abstract
We present the structural and magnetic properties of Fe2 As thin films grown on Si(100) by molecular beam epitaxy. From the reflection high-energy electron diffraction and x-ray diffraction patterns, the orientation of Fe2 As film on Si(100) was found to be a c -axis in the tetragonal crystal structure. The tetragonal Fe2 As thin film exhibited ferrimagnetic (FIM) ordering at room temperature. The magnetic moment of Fe2 As was 0.1 μB / unit cell determined from the saturated magnetic moment. The observed FIM in Fe2 As films was attributed to the strain in the film.
| Original language | English (US) |
|---|---|
| Article number | 07A946 |
| Journal | Journal of Applied Physics |
| Volume | 105 |
| Issue number | 7 |
| DOIs | |
| State | Published - 2009 |
Funding
This work was supported by the Korea Science and Engineering Foundation (KOSEF) through the National Research Laboratory program funded by the Ministry of Science and Technology (Grant No. R0A-2006-000-10241-0) and the SRC/ERC program (Grant No. R11-2000-071). FIG. 1. RHEED patterns of (a) Si(100) substrate and (b) 1000-Å-thick Fe 2 As epitaxial film along Si[110] azimuth. (c) The XRD pattern of the Fe 2 As epitaxial film. (d) A simple illustration of the epitaxial relationship of tetragonal Fe 2 As and Si(100) substrate. FIG. 2. (a) Temperature dependence of magnetization ( M ) in a 1000 Oe magnetic field. (b) Magnetization vs magnetic field at 10, 150, 300, and 350 K. At 350 K, the sample shows AFM behavior as shown in the inset. FIG. 3. (a) Temperature dependence of the zero-field electrical resistivity. MR of Fe 2 As film on Si(100) at 300 K. The MR is shown in two orthogonal directions, with (b) J ⊥ H and (c) J ∥ H , where J and H are the current density and applied field, respectively. (d) MR vs magnetic field curves at 50, 100, 200, and 250 K in J ∥ H geometry.
ASJC Scopus subject areas
- General Physics and Astronomy