Focused ion beam based sample preparation techniques

Richard Langford, Amanda Petford-Long, Peter Gnauck

Research output: Contribution to journalArticle

4 Scopus citations
Original languageEnglish (US)
Pages (from-to)46-47
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
DOIs
StatePublished - 2002

ASJC Scopus subject areas

  • Instrumentation

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