Focused ion-beam milling for field-ion specimen preparation: Preliminary investigations

D. J. Larson*, D. T. Foord, A. K. Petford-Long, T. C. Anthony, I. M. Rozdilsky, A. Cerezo, G. W D Smith

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

86 Scopus citations

Fingerprint

Dive into the research topics of 'Focused ion-beam milling for field-ion specimen preparation: Preliminary investigations'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science