Four-dimensional morphological evolution of an aluminum silicon alloy using propagation-based phase contrast x-ray tomographic microscopy

Emine Begum Gulsoy, Ashwin J. Shahani, John W. Gibbs, Julie L. Fife, Peter W. Voorhees

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

Four-dimensional propagation-based phase contrast X-ray tomographic microscopy experiments were performed on an Aluminum- 29.9 mass% Silicon alloy during coarsening. Using propagation-based phase contrast, changes in the three-dimensional morphology of primary silicon particles were captured and the resulting evolution of the microstructure is discussed. While morphologies at earlier times are complex, faceted and highly interconnected, the morphologies at later times are less faceted but remain quite complex.

Original languageEnglish (US)
Pages (from-to)161-164
Number of pages4
JournalMaterials Transactions
Volume55
Issue number1
DOIs
StatePublished - 2014

Keywords

  • Aluminumsilicon alloy
  • Coarsening
  • Microstructural characterization
  • Propagation-based phase contrast
  • X-ray tomographic microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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