Four-point measurements of n- and p-type two-dimensional systems fabricated with cleaved-edge overgrowth

M. Grayson*, S. F. Roth, Y. Xiang, F. Fischer, D. Schuh, M. Bichler

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We demonstrate a contact design that allows four-terminal magnetotransport measurements of cleaved-edge overgrown two-dimensional electron and hole systems. By lithographically patterning and etching a bulk-doped surface layer, finger-shaped leads are fabricated, which contact the two-dimensional systems on the cleave facet. Both n - and p -type two-dimensional systems are demonstrated at the cleaved edge, using Si as either donor or acceptor, dependent on the growth conditions. Four-point measurements of both gated and modulation-doped samples yield fractional quantum Hall features for both n and p types, with several higher-order fractions evident in n -type modulation-doped samples.

Original languageEnglish (US)
Article number212113
Pages (from-to)1-2
Number of pages2
JournalApplied Physics Letters
Volume87
Issue number21
DOIs
StatePublished - 2005

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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