Abstract
We demonstrate a contact design that allows four-terminal magnetotransport measurements of cleaved-edge overgrown two-dimensional electron and hole systems. By lithographically patterning and etching a bulk-doped surface layer, finger-shaped leads are fabricated, which contact the two-dimensional systems on the cleave facet. Both n - and p -type two-dimensional systems are demonstrated at the cleaved edge, using Si as either donor or acceptor, dependent on the growth conditions. Four-point measurements of both gated and modulation-doped samples yield fractional quantum Hall features for both n and p types, with several higher-order fractions evident in n -type modulation-doped samples.
Original language | English (US) |
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Article number | 212113 |
Pages (from-to) | 1-2 |
Number of pages | 2 |
Journal | Applied Physics Letters |
Volume | 87 |
Issue number | 21 |
DOIs | |
State | Published - 2005 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)