Fracture strength of ultrananocrystalline diamond thin films - Identification of Weibull parameters

H. D. Espinosa; B. Peng; B. C. Prorok; N. Moldovan; O. Auciello; J. A. Carlisle; D. M. Gruen; D. C. Mancini

doi:10.1063/1.1613372

Fracture strength of ultrananocrystalline diamond thin films - Identification of Weibull parameters

H. D. Espinosa^*, B. Peng, B. C. Prorok, N. Moldovan, O. Auciello, J. A. Carlisle, D. M. Gruen, D. C. Mancini

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

106 Scopus citations

Abstract

The fracture strength of ultrananocrystalline diamond (UNCD) thin films was investigated. The fracture strength which followed a Weibull distribution was presented by the data. It was found that the Weibull parameters were highly dependent on the seeding process used in the growth of the films.

Original language	English (US)
Pages (from-to)	6076-6084
Number of pages	9
Journal	Journal of Applied Physics
Volume	94
Issue number	9
DOIs	https://doi.org/10.1063/1.1613372
State	Published - Nov 1 2003
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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title = "Fracture strength of ultrananocrystalline diamond thin films - Identification of Weibull parameters",

abstract = "The fracture strength of ultrananocrystalline diamond (UNCD) thin films was investigated. The fracture strength which followed a Weibull distribution was presented by the data. It was found that the Weibull parameters were highly dependent on the seeding process used in the growth of the films.",

author = "Espinosa, {H. D.} and B. Peng and Prorok, {B. C.} and N. Moldovan and O. Auciello and Carlisle, {J. A.} and Gruen, {D. M.} and Mancini, {D. C.}",

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AU - Espinosa, H. D.

AU - Peng, B.

AU - Prorok, B. C.

AU - Moldovan, N.

AU - Auciello, O.

AU - Carlisle, J. A.

AU - Gruen, D. M.

AU - Mancini, D. C.

PY - 2003/11/1

Y1 - 2003/11/1

N2 - The fracture strength of ultrananocrystalline diamond (UNCD) thin films was investigated. The fracture strength which followed a Weibull distribution was presented by the data. It was found that the Weibull parameters were highly dependent on the seeding process used in the growth of the films.

AB - The fracture strength of ultrananocrystalline diamond (UNCD) thin films was investigated. The fracture strength which followed a Weibull distribution was presented by the data. It was found that the Weibull parameters were highly dependent on the seeding process used in the growth of the films.

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M3 - Article

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Fracture strength of ultrananocrystalline diamond thin films - Identification of Weibull parameters

Abstract

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