Abstract
Room-temperature, bottom-gate, field-effect transistor characteristics of 2D ultrathin layer GaS and GaSe prepared from the bulk crystals using a micromechanical cleavage technique are reported. The transistors based on active GaS and GaSe ultrathin layers demonstrate typical n-and p-type conductance transistor operation along with a good ON/OFF ratio and electron differential mobility.
Original language | English (US) |
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Pages (from-to) | 3549-3554 |
Number of pages | 6 |
Journal | Advanced Materials |
Volume | 24 |
Issue number | 26 |
DOIs | |
State | Published - Jul 10 2012 |
Keywords
- GaS
- GaSe
- layered materials
- photodetectors
- semiconductors
- transistors
ASJC Scopus subject areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering