GPI observational calibrations XIV: Polarimetric contrasts and new data reduction techniques

Maxwell A. Millar-Blanchaer*, Marshall D. Perrin, Li Wei Hung, Michael P. Fitzgerald, Jason J. Wang, Jeffrey Chilcote, James R. Graham, Sebastian Bruzzone, Paul G. Kalas

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

22 Scopus citations


The Gemini Planet Imager (GPI) has been designed for the direct detection and characterization of exoplanets and circumstellar disks. GPI is equipped with a dual channel polarimetry mode designed to take advantage of the inherently polarized light scattered off circumstellar material to further suppress the residual seeing haloleft uncorrected by the adaptive optics. We explore how recent advances in data reduction techniques reduce systematics and improve the achievable contrast in polarimetry mode. In particular, we consider different flux extraction techniques when constructing datacubes from raw data, division by a polarized at-field and a method for subtracting instrumental polarization. Using observations of unpolarized standard stars we find that GPI's instrumental polarization is consistent with being wavelength independent within our errors. In addition, we provide polarimetry contrast curves that demonstrate typical performance throughout the GPIES campaign.

Original languageEnglish (US)
Title of host publicationGround-Based and Airborne Instrumentation for Astronomy VI
EditorsLuc Simard, Christopher J. Evans, Hideki Takami
ISBN (Electronic)9781510601956
StatePublished - 2016
EventGround-Based and Airborne Instrumentation for Astronomy VI - Edinburgh, United Kingdom
Duration: Jun 26 2016Jun 30 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceGround-Based and Airborne Instrumentation for Astronomy VI
Country/TerritoryUnited Kingdom


  • Gemini Planet Imager
  • High-contrast imaging
  • Polarimetry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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