We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
|Original language||English (US)|
|Journal||Journal of Physics: Conference Series|
|State||Published - 2016|
|Event||16th International Conference on X-Ray Absorption Fine Structure, XAFS 2015 - Karlsruhe, Germany|
Duration: Aug 23 2015 → Aug 28 2015
ASJC Scopus subject areas
- Physics and Astronomy(all)