Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film

S. L. Moffitt, Q. Ma, D. B. Buchholz, R. P.H. Chang, M. J. Bedzyk, T. O. Mason

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations


We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.

Original languageEnglish (US)
Article number012116
JournalJournal of Physics: Conference Series
Issue number1
StatePublished - 2016
Event16th International Conference on X-Ray Absorption Fine Structure, XAFS 2015 - Karlsruhe, Germany
Duration: Aug 23 2015Aug 28 2015

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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