Abstract
We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
Original language | English (US) |
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Article number | 012116 |
Journal | Journal of Physics: Conference Series |
Volume | 712 |
Issue number | 1 |
DOIs | |
State | Published - 2016 |
Event | 16th International Conference on X-Ray Absorption Fine Structure, XAFS 2015 - Karlsruhe, Germany Duration: Aug 23 2015 → Aug 28 2015 |
ASJC Scopus subject areas
- General Physics and Astronomy