Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film

S. L. Moffitt, Q. Ma, D. B. Buchholz, R P H Chang, Michael J Bedzyk, Thomas O Mason

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.

Original languageEnglish (US)
Article number012116
JournalJournal of Physics: Conference Series
Volume712
Issue number1
DOIs
StatePublished - Jan 1 2016
Event16th International Conference on X-Ray Absorption Fine Structure, XAFS 2015 - Karlsruhe, Germany
Duration: Aug 23 2015Aug 28 2015

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grazing incidence
thin films
x rays
coordination number
rutile
absorption spectroscopy
conduction

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

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title = "Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film",
abstract = "We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30{\%} Zn doping, the local structure in the film is rutile-like.",
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Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film. / Moffitt, S. L.; Ma, Q.; Buchholz, D. B.; Chang, R P H; Bedzyk, Michael J; Mason, Thomas O.

In: Journal of Physics: Conference Series, Vol. 712, No. 1, 012116, 01.01.2016.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film

AU - Moffitt, S. L.

AU - Ma, Q.

AU - Buchholz, D. B.

AU - Chang, R P H

AU - Bedzyk, Michael J

AU - Mason, Thomas O

PY - 2016/1/1

Y1 - 2016/1/1

N2 - We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.

AB - We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.

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