Growth and characterization of C-N thin films

Keyphrases

• Transmission Electron Microscopy 100%
• Carbon Nitride 100%
• Ambient Temperature 50%
• Diamond 50%
• Atomic Force Microscopy 50%
• Energy Dispersive X-ray Analysis 50%
• Diagnostic Techniques 50%
• Electron Microscopy Studies 50%
• Gaseous Species 50%
• Reactive Magnetron Sputtering 50%
• Auger Electron Spectroscopy 50%
• Chemically Bonded 50%
• Friction Coefficient 50%
• 52100 Steel 50%
• Dry Sliding Wear 50%
• Scanning Electron Microscopy/energy Dispersive Spectroscopy 50%
• Lubricated Sliding 50%
• IR Spectroscopy 50%
• Crystalline Form 50%
• Wear-resistant 50%
• N-phase 50%
• IR Studies 50%
• C-ratio 50%
• Amorphous Form 50%
• Zirconia Substrate 50%
• Tribotest 50%
• Sliding Condition 50%
• Steel Carbon 50%
• Polycrystalline Zirconia 50%

Engineering

• Nitride 100%
• Thin Films 100%
• C/N Ratio 50%
• Gaseous Specie 50%
• Energy-Dispersive X-Ray Analysis 50%
• Sliding Condition 50%
• Atomic Force Microscopy 50%
• Diamond 50%
• Carbon Steel 50%
• Polycrystalline 50%
• Magnetron 50%
• Coefficient of Friction 50%

Material Science

• Film 100%
• Thin Films 100%
• Carbon Nitride 40%
• Transmission Electron Microscopy 40%
• Magnetron Sputtering 20%
• Zirconium 20%
• Energy Dispersive X Ray Analysis 20%
• Scanning Electron Microscopy-Energy Dispersive X-Ray 20%
• Atomic Force Microscopy 20%
• Diamond 20%