Growth and characterization of InAs/GaSb type II superlattices for long-wavelength infrared detectors

Hooman Mohseni*, Erick Michel, Manijeh Razeghi, William Mitchel, Gail Brown

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

15 Scopus citations

Abstract

We report the molecular beam epitaxial growth and characterization of InAs/GaSb superlattices grown on semi-insulating GaAs substrates for long wavelength infrared detectors. Photoconductive detectors fabricated from the superlattices showed 80% cut-off at 11.6 μm and peak responsivity of 6.5 V/W with Johnson noise limited detectivity of 2.36×109 cm·Hz1/2/W at 10.7 μm at 78 K. The responsivity decreases at higher temperatures with a T2 behavior rather than exponential decay, and at room temperature the responsivity is about 660 mV/W at 11 μm. Lower Auger recombination rate in this system provides comparable detectivity to the best HgCdTe detectors at 300 K. Higher uniformity over large areas, simpler growth and the possibility of having read-out circuits in the same GaAs chip are the advantages of this system over HgCdTe detectors for near room temperature operation.

Original languageEnglish (US)
Pages (from-to)30-37
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3287
DOIs
StatePublished - Dec 1 1998
EventPhotodetectors: Materials and Devices III - San Jose, CA, United States
Duration: Jan 28 1998Jan 30 1998

Keywords

  • Detectivity
  • HgCdTe
  • Infrared detector
  • Noise
  • Quantum well
  • Type II
  • Uncooled detector

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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