Growth and in situ x-ray characterization of YBa2Cu 3Ox/LaAlO3 superlattices

S. M. Williams*, S. Maglic, C. Thomas, C. T. Lin, M. J. Wagoner, R. P.H. Chang, J. B. Ketterson

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

We utilized a miniature sputtering cell with mylar windows and multitarget sputtering guns in order to study the growth of YBCO/LaAlO3 superlattices on SrTiO3 substrates. Computer modeling of the diffraction spectra enabled us to determine the interface width between the layers. After deposition of the superlattices, the substrate temperature was increased to study any interdiffusion.

Original languageEnglish (US)
Number of pages1
JournalApplied Physics Letters
StatePublished - Dec 1 1995

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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