Growth and properties of epitaxial PtMn/NiFe bilayers on Si (001) substrate containing directly deposited ordered PtMn

Young Suk Choi; Amanda K. Petford-Long; Roger C C Ward

doi:10.1016/j.tsf.2005.04.120

Growth and properties of epitaxial PtMn/NiFe bilayers on Si (001) substrate containing directly deposited ordered PtMn

Young Suk Choi^*, Amanda K. Petford-Long, Roger C C Ward

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Equiatomic PtMn layers have been grown epitaxially on Si (001), with the face-centered tetragonal L1₀-ordered antiferromagnetic phase forming without post-growth magnetic field annealing. The thickness dependence of the exchange anisotropy field and coercivity of the NiFe ferromagnetic layer in the epitaxial PtMn/NiFe exchange-coupled bilayers showed the critical thickness of the PtMn to be 10 nm. The exchange biasing properties are stabilised above a PtMn thickness of 15 nm which is much lower than that for polycrystalline PtMn-based exchange-biased systems. The highest value of exchange-bias is observed for a NiFe ferromagnetic layer thickness of 6 nm. The temperature dependence of the magnetic properties in the range 50-400 K shows that H _ex and H_c increase monotonically in a quasi-linear manner as temperature decreases. Non-saturation of the in-plane magnetisation component of the PtMn, due to the Néel axis lying normal to the interface, is suggested to be responsible for the temperature dependence.

Original language	English (US)
Pages (from-to)	186-191
Number of pages	6
Journal	Thin Solid Films
Volume	489
Issue number	1-2
DOIs	https://doi.org/10.1016/j.tsf.2005.04.120
State	Published - Oct 1 2005

Keywords

Epitaxy
Exchange biasing
PtMn/NiFe
Spontaneous growth

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2005.04.120

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@article{ef54d6daa363490b98ba0b83f0be1e1f,

title = "Growth and properties of epitaxial PtMn/NiFe bilayers on Si (001) substrate containing directly deposited ordered PtMn",

abstract = "Equiatomic PtMn layers have been grown epitaxially on Si (001), with the face-centered tetragonal L10-ordered antiferromagnetic phase forming without post-growth magnetic field annealing. The thickness dependence of the exchange anisotropy field and coercivity of the NiFe ferromagnetic layer in the epitaxial PtMn/NiFe exchange-coupled bilayers showed the critical thickness of the PtMn to be 10 nm. The exchange biasing properties are stabilised above a PtMn thickness of 15 nm which is much lower than that for polycrystalline PtMn-based exchange-biased systems. The highest value of exchange-bias is observed for a NiFe ferromagnetic layer thickness of 6 nm. The temperature dependence of the magnetic properties in the range 50-400 K shows that H ex and Hc increase monotonically in a quasi-linear manner as temperature decreases. Non-saturation of the in-plane magnetisation component of the PtMn, due to the N{\'e}el axis lying normal to the interface, is suggested to be responsible for the temperature dependence.",

keywords = "Epitaxy, Exchange biasing, PtMn/NiFe, Spontaneous growth",

author = "Choi, {Young Suk} and Petford-Long, {Amanda K.} and Ward, {Roger C C}",

note = "Funding Information: This work is supported by Engineering and Physical Science Research Council (EPSRC). The authors are grateful to the Heads of the Department of Materials and Department of Physics for laboratory space. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.",

year = "2005",

month = oct,

day = "1",

doi = "10.1016/j.tsf.2005.04.120",

language = "English (US)",

volume = "489",

pages = "186--191",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Growth and properties of epitaxial PtMn/NiFe bilayers on Si (001) substrate containing directly deposited ordered PtMn

AU - Choi, Young Suk

AU - Petford-Long, Amanda K.

AU - Ward, Roger C C

N1 - Funding Information: This work is supported by Engineering and Physical Science Research Council (EPSRC). The authors are grateful to the Heads of the Department of Materials and Department of Physics for laboratory space. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.

PY - 2005/10/1

Y1 - 2005/10/1

N2 - Equiatomic PtMn layers have been grown epitaxially on Si (001), with the face-centered tetragonal L10-ordered antiferromagnetic phase forming without post-growth magnetic field annealing. The thickness dependence of the exchange anisotropy field and coercivity of the NiFe ferromagnetic layer in the epitaxial PtMn/NiFe exchange-coupled bilayers showed the critical thickness of the PtMn to be 10 nm. The exchange biasing properties are stabilised above a PtMn thickness of 15 nm which is much lower than that for polycrystalline PtMn-based exchange-biased systems. The highest value of exchange-bias is observed for a NiFe ferromagnetic layer thickness of 6 nm. The temperature dependence of the magnetic properties in the range 50-400 K shows that H ex and Hc increase monotonically in a quasi-linear manner as temperature decreases. Non-saturation of the in-plane magnetisation component of the PtMn, due to the Néel axis lying normal to the interface, is suggested to be responsible for the temperature dependence.

AB - Equiatomic PtMn layers have been grown epitaxially on Si (001), with the face-centered tetragonal L10-ordered antiferromagnetic phase forming without post-growth magnetic field annealing. The thickness dependence of the exchange anisotropy field and coercivity of the NiFe ferromagnetic layer in the epitaxial PtMn/NiFe exchange-coupled bilayers showed the critical thickness of the PtMn to be 10 nm. The exchange biasing properties are stabilised above a PtMn thickness of 15 nm which is much lower than that for polycrystalline PtMn-based exchange-biased systems. The highest value of exchange-bias is observed for a NiFe ferromagnetic layer thickness of 6 nm. The temperature dependence of the magnetic properties in the range 50-400 K shows that H ex and Hc increase monotonically in a quasi-linear manner as temperature decreases. Non-saturation of the in-plane magnetisation component of the PtMn, due to the Néel axis lying normal to the interface, is suggested to be responsible for the temperature dependence.

KW - Epitaxy

KW - Exchange biasing

KW - PtMn/NiFe

KW - Spontaneous growth

UR - http://www.scopus.com/inward/record.url?scp=23244435897&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=23244435897&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2005.04.120

DO - 10.1016/j.tsf.2005.04.120

M3 - Article

AN - SCOPUS:23244435897

SN - 0040-6090

VL - 489

SP - 186

EP - 191

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Growth and properties of epitaxial PtMn/NiFe bilayers on Si (001) substrate containing directly deposited ordered PtMn

Abstract

Keywords

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