Growth and structural characterization of multiferroic thin films and nanopatterns

S. Xie*, Z. Pan, J. Cheng, G. E. Sterbinsky, B. W. Wessels, V. P. Dravid

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1026-1027
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009

ASJC Scopus subject areas

  • Instrumentation

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