@article{f5bd7dfdfdd24467bd93b81910556c5b,
title = "Growth and structural characterization of multiferroic thin films and nanopatterns",
author = "S. Xie and Z. Pan and J. Cheng and Sterbinsky, {G. E.} and Wessels, {B. W.} and Dravid, {V. P.}",
note = "Funding Information: [3] R. Ramesh, N. A. Spaldin, Nat. Mater. 6 (2007) 21. [4] Z. Pan, S. Li, Z. Wang, M.F. Yu, V.P. Dravid, Appl. Phys. Lett., 91 (2007) 143105. [5] H. K. Schmid, W. Mader, Micron 37 (2006) 426. [6] This work was supported by the NSF-MRSEC, NSF-NSEC and U.S. DOE-BES. The microscopy work was supported by NUANCE Center which is supported by NSF-NSEC, NSF-MRSEC, Keck Foundation, the State of Illinois, and Northwestern University.",
year = "2009",
month = jul,
doi = "10.1017/S1431927609097050",
language = "English (US)",
volume = "15",
pages = "1026--1027",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",
}