Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4

Rhett T. Brewer*, David A. Boyd, Mohamed Y. El-Naggar, Stacey W. Boland, Young Bae Park, Sossina M. Haile, David G. Goodwin, Harry A. Atwater

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We prepared highly-aligned, biaxially textured Ba xPb 1-xTiO 3 (PBT) on amorphous Si 3N 4 by using ion beam-assisted deposited (IBAD) MgO as a template layer. PBT was deposited on biaxially textured MgO using solgel synthesis, metallorganic chemical vapor deposition (MOCVD), and molecular beam epitaxy (MBE). The biaxial texture of the PBT was inherited from the MgO template. Reflection high-energy electron diffraction (RHEED) and cross section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction (XRD), RHEED, and TEM. Dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.

Original languageEnglish (US)
Title of host publicationEpitaxial Growth of Functional Oxides - Proceedings of the International Symposium
EditorsA. Goyal, Y. Kuo, O. Leonte, W. Wong-Ng
Pages167-180
Number of pages14
VolumePV 2003-29
StatePublished - Dec 13 2005
EventEpitaxial Growth of Functional Oxides - Proceedings of the International Symposium - Orlando, FL, United States
Duration: Oct 12 2003Oct 17 2003

Other

OtherEpitaxial Growth of Functional Oxides - Proceedings of the International Symposium
CountryUnited States
CityOrlando, FL
Period10/12/0310/17/03

ASJC Scopus subject areas

  • Engineering(all)

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