Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4

Rhett T. Brewer; David A. Boyd; Mohamed Y. El-Naggar; Stacey W. Boland; Young Bae Park; Sossina M. Haile; David G. Goodwin; Harry A. Atwater

Growth of biaxially textured Ba _xPb _1-xTiO ₃ ferroelectric thin films on amorphous Si ₃N ₄

Rhett T. Brewer^*, David A. Boyd, Mohamed Y. El-Naggar, Stacey W. Boland, Young Bae Park, Sossina M. Haile, David G. Goodwin, Harry A. Atwater

^*Corresponding author for this work

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We prepared highly-aligned, biaxially textured Ba _xPb _1-xTiO ₃ (PBT) on amorphous Si ₃N ₄ by using ion beam-assisted deposited (IBAD) MgO as a template layer. PBT was deposited on biaxially textured MgO using solgel synthesis, metallorganic chemical vapor deposition (MOCVD), and molecular beam epitaxy (MBE). The biaxial texture of the PBT was inherited from the MgO template. Reflection high-energy electron diffraction (RHEED) and cross section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction (XRD), RHEED, and TEM. Dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.

Original language	English (US)
Title of host publication	Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium
Editors	A. Goyal, Y. Kuo, O. Leonte, W. Wong-Ng
Pages	167-180
Number of pages	14
Volume	PV 2003-29
State	Published - Dec 13 2005
Event	Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium - Orlando, FL, United States Duration: Oct 12 2003 → Oct 17 2003

Other

Other	Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium
Country/Territory	United States
City	Orlando, FL
Period	10/12/03 → 10/17/03

ASJC Scopus subject areas

General Engineering

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Brewer, R. T., Boyd, D. A., El-Naggar, M. Y., Boland, S. W., Park, Y. B., Haile, S. M., Goodwin, D. G., & Atwater, H. A. (2005). Growth of biaxially textured Ba _xPb _1-xTiO ₃ ferroelectric thin films on amorphous Si ₃N ₄ In A. Goyal, Y. Kuo, O. Leonte, & W. Wong-Ng (Eds.), Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium (Vol. PV 2003-29, pp. 167-180)

@inproceedings{ac6c465d06644ebcaa81f55011349f1b,

title = "Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4 ",

abstract = "We prepared highly-aligned, biaxially textured Ba xPb 1-xTiO 3 (PBT) on amorphous Si 3N 4 by using ion beam-assisted deposited (IBAD) MgO as a template layer. PBT was deposited on biaxially textured MgO using solgel synthesis, metallorganic chemical vapor deposition (MOCVD), and molecular beam epitaxy (MBE). The biaxial texture of the PBT was inherited from the MgO template. Reflection high-energy electron diffraction (RHEED) and cross section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction (XRD), RHEED, and TEM. Dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.",

author = "Brewer, {Rhett T.} and Boyd, {David A.} and El-Naggar, {Mohamed Y.} and Boland, {Stacey W.} and Park, {Young Bae} and Haile, {Sossina M.} and Goodwin, {David G.} and Atwater, {Harry A.}",

year = "2005",

month = dec,

day = "13",

language = "English (US)",

volume = "PV 2003-29",

pages = "167--180",

editor = "A. Goyal and Y. Kuo and O. Leonte and W. Wong-Ng",

booktitle = "Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium",

note = "Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium ; Conference date: 12-10-2003 Through 17-10-2003",

}

Brewer, RT, Boyd, DA, El-Naggar, MY, Boland, SW, Park, YB, Haile, SM, Goodwin, DG & Atwater, HA 2005, Growth of biaxially textured Ba _xPb _1-xTiO ₃ ferroelectric thin films on amorphous Si ₃N ₄ in A Goyal, Y Kuo, O Leonte & W Wong-Ng (eds), Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium. vol. PV 2003-29, pp. 167-180, Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium, Orlando, FL, United States, 10/12/03.

Growth of biaxially textured Ba _xPb _1-xTiO ₃ ferroelectric thin films on amorphous Si ₃N ₄ . / Brewer, Rhett T.; Boyd, David A.; El-Naggar, Mohamed Y. et al.
Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium. ed. / A. Goyal; Y. Kuo; O. Leonte; W. Wong-Ng. Vol. PV 2003-29 2005. p. 167-180.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4

AU - Brewer, Rhett T.

AU - Boyd, David A.

AU - El-Naggar, Mohamed Y.

AU - Boland, Stacey W.

AU - Park, Young Bae

AU - Haile, Sossina M.

AU - Goodwin, David G.

AU - Atwater, Harry A.

PY - 2005/12/13

Y1 - 2005/12/13

N2 - We prepared highly-aligned, biaxially textured Ba xPb 1-xTiO 3 (PBT) on amorphous Si 3N 4 by using ion beam-assisted deposited (IBAD) MgO as a template layer. PBT was deposited on biaxially textured MgO using solgel synthesis, metallorganic chemical vapor deposition (MOCVD), and molecular beam epitaxy (MBE). The biaxial texture of the PBT was inherited from the MgO template. Reflection high-energy electron diffraction (RHEED) and cross section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction (XRD), RHEED, and TEM. Dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.

AB - We prepared highly-aligned, biaxially textured Ba xPb 1-xTiO 3 (PBT) on amorphous Si 3N 4 by using ion beam-assisted deposited (IBAD) MgO as a template layer. PBT was deposited on biaxially textured MgO using solgel synthesis, metallorganic chemical vapor deposition (MOCVD), and molecular beam epitaxy (MBE). The biaxial texture of the PBT was inherited from the MgO template. Reflection high-energy electron diffraction (RHEED) and cross section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction (XRD), RHEED, and TEM. Dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.

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M3 - Conference contribution

AN - SCOPUS:28544432787

VL - PV 2003-29

SP - 167

EP - 180

BT - Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium

A2 - Goyal, A.

A2 - Kuo, Y.

A2 - Leonte, O.

A2 - Wong-Ng, W.

T2 - Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium

Y2 - 12 October 2003 through 17 October 2003

ER -

Growth of biaxially textured Ba _xPb _1-xTiO ₃ ferroelectric thin films on amorphous Si ₃N ₄

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