Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4

Rhett T. Brewer*, David A. Boyd, Mohamed Y. El-Naggar, Stacey W. Boland, Young Bae Park, Sossina M. Haile, David G. Goodwin, Harry A. Atwater

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations


We prepared highly aligned, biaxially textured Ba xPb 1-xTiO 3 (PBT) on amorphous Si 3N 4 by using an ion-beam-assisted deposited MgO as a template layer. PBT was deposited on a biaxially textured MgO using sol-gel synthesis, metal-organic chemical-vapor deposition, and molecular beam epitaxy. The biaxial texture of the PBT was inherited from the MgO template. The reflection high-energy electron diffraction (RHEED) and cross-section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction, RHEED, and TEM. The dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.

Original languageEnglish (US)
Article number034103
JournalJournal of Applied Physics
Issue number3
StatePublished - Feb 1 2005

ASJC Scopus subject areas

  • General Physics and Astronomy


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