Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4

Rhett T. Brewer; David A. Boyd; Mohamed Y. El-Naggar; Stacey W. Boland; Young Bae Park; Sossina M. Haile; David G. Goodwin; Harry A. Atwater

doi:10.1063/1.1806994

Growth of biaxially textured Ba _xPb _1-xTiO ₃ ferroelectric thin films on amorphous Si ₃N ₄

Rhett T. Brewer^*, David A. Boyd, Mohamed Y. El-Naggar, Stacey W. Boland, Young Bae Park, Sossina M. Haile, David G. Goodwin, Harry A. Atwater

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

We prepared highly aligned, biaxially textured Ba _xPb _1-xTiO ₃ (PBT) on amorphous Si ₃N ₄ by using an ion-beam-assisted deposited MgO as a template layer. PBT was deposited on a biaxially textured MgO using sol-gel synthesis, metal-organic chemical-vapor deposition, and molecular beam epitaxy. The biaxial texture of the PBT was inherited from the MgO template. The reflection high-energy electron diffraction (RHEED) and cross-section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction, RHEED, and TEM. The dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.

Original language	English (US)
Article number	034103
Journal	Journal of Applied Physics
Volume	97
Issue number	3
DOIs	https://doi.org/10.1063/1.1806994
State	Published - Feb 1 2005

ASJC Scopus subject areas

Physics and Astronomy(all)

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@article{248fd6d3261d40119a27b6a982920c73,

title = "Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4 ",

abstract = "We prepared highly aligned, biaxially textured Ba xPb 1-xTiO 3 (PBT) on amorphous Si 3N 4 by using an ion-beam-assisted deposited MgO as a template layer. PBT was deposited on a biaxially textured MgO using sol-gel synthesis, metal-organic chemical-vapor deposition, and molecular beam epitaxy. The biaxial texture of the PBT was inherited from the MgO template. The reflection high-energy electron diffraction (RHEED) and cross-section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction, RHEED, and TEM. The dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.",

author = "Brewer, {Rhett T.} and Boyd, {David A.} and El-Naggar, {Mohamed Y.} and Boland, {Stacey W.} and Park, {Young Bae} and Haile, {Sossina M.} and Goodwin, {David G.} and Atwater, {Harry A.}",

note = "Funding Information: The authors would like to thank D. G. Schlom for the helpful discussions about MBE and Carol Garland for the TEM assistance. One of the authors (Y.-B.P.) would like to acknowledge the support of the Postdoctoral Fellowship Program from Korea Science and Engineering Foundation (KOSEF). This work was supported by ARO MURI Grant No. DAAD19-01-1-0517. An additional support has been provided by the National Science Foundation, through the Caltech Center for the Science and Engineering of Materials.",

year = "2005",

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doi = "10.1063/1.1806994",

language = "English (US)",

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T1 - Growth of biaxially textured Ba xPb 1-xTiO 3 ferroelectric thin films on amorphous Si 3N 4

AU - Brewer, Rhett T.

AU - Boyd, David A.

AU - El-Naggar, Mohamed Y.

AU - Boland, Stacey W.

AU - Park, Young Bae

AU - Haile, Sossina M.

AU - Goodwin, David G.

AU - Atwater, Harry A.

N1 - Funding Information: The authors would like to thank D. G. Schlom for the helpful discussions about MBE and Carol Garland for the TEM assistance. One of the authors (Y.-B.P.) would like to acknowledge the support of the Postdoctoral Fellowship Program from Korea Science and Engineering Foundation (KOSEF). This work was supported by ARO MURI Grant No. DAAD19-01-1-0517. An additional support has been provided by the National Science Foundation, through the Caltech Center for the Science and Engineering of Materials.

PY - 2005/2/1

Y1 - 2005/2/1

N2 - We prepared highly aligned, biaxially textured Ba xPb 1-xTiO 3 (PBT) on amorphous Si 3N 4 by using an ion-beam-assisted deposited MgO as a template layer. PBT was deposited on a biaxially textured MgO using sol-gel synthesis, metal-organic chemical-vapor deposition, and molecular beam epitaxy. The biaxial texture of the PBT was inherited from the MgO template. The reflection high-energy electron diffraction (RHEED) and cross-section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction, RHEED, and TEM. The dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.

AB - We prepared highly aligned, biaxially textured Ba xPb 1-xTiO 3 (PBT) on amorphous Si 3N 4 by using an ion-beam-assisted deposited MgO as a template layer. PBT was deposited on a biaxially textured MgO using sol-gel synthesis, metal-organic chemical-vapor deposition, and molecular beam epitaxy. The biaxial texture of the PBT was inherited from the MgO template. The reflection high-energy electron diffraction (RHEED) and cross-section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction, RHEED, and TEM. The dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.

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Growth of biaxially textured Ba _xPb _1-xTiO ₃ ferroelectric thin films on amorphous Si ₃N ₄

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