Abstract
The synthesis, characterization and thermal stability characteristics of phosphine complex are described. A scanning electron microscopic (SEM) image of the chalcocite thin film reveals large plates with in-plane dimensions in the ∼1-2μm range. It was shown that the crystallographic orientation and the film microstructure are suitable for growth of highly oriented chalocite thin films. The results show that phosphine-stabilized copper(I) thiolates are applicable in a new class of single-source Cu 2S precursors.
Original language | English (US) |
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Pages (from-to) | 4286-4288 |
Number of pages | 3 |
Journal | Chemistry of Materials |
Volume | 17 |
Issue number | 17 |
DOIs | |
State | Published - Aug 23 2005 |
ASJC Scopus subject areas
- Chemistry(all)
- Chemical Engineering(all)
- Materials Chemistry