TY - JOUR
T1 - Half-metallic exchange bias ferromagnetic/antiferromagnetic interfaces in transition-metal chalcogenides
AU - Nakamura, Kohji
AU - Kato, Yoshinori
AU - Akiyama, Toru
AU - Ito, Tomonori
AU - Freeman, A. J.
PY - 2006/1/1
Y1 - 2006/1/1
N2 - To investigate half-metallic exchange bias interfaces, magnetic structures at ferromagnetic (FM)/antiferromagnetic (AFM) interfaces in the zinc blende transition-metal chalcogenides, CrSe/MnSe and CrTe/MnTe with compensated and uncompensated AFM interfaces, were determined by the full-potential linearized augmented plane-wave method. With the uncompensated AFM interface, an antiparallel alignment of the Cr and Mn moments induces an excellent half-metallicity. More striking still, in the compensated AFM interface the Cr moments in the FM layer lie perpendicular to the Mn moments in the AFM layer but the Mn moments strongly cant to induce a net moment so as to retain the half-metallicity. These findings may offer a key ingredient for exchange biased spintronic devices with 100% spin polarization, having a unidirectional anisotropy to control and manipulate spins at the nanoscale.
AB - To investigate half-metallic exchange bias interfaces, magnetic structures at ferromagnetic (FM)/antiferromagnetic (AFM) interfaces in the zinc blende transition-metal chalcogenides, CrSe/MnSe and CrTe/MnTe with compensated and uncompensated AFM interfaces, were determined by the full-potential linearized augmented plane-wave method. With the uncompensated AFM interface, an antiparallel alignment of the Cr and Mn moments induces an excellent half-metallicity. More striking still, in the compensated AFM interface the Cr moments in the FM layer lie perpendicular to the Mn moments in the AFM layer but the Mn moments strongly cant to induce a net moment so as to retain the half-metallicity. These findings may offer a key ingredient for exchange biased spintronic devices with 100% spin polarization, having a unidirectional anisotropy to control and manipulate spins at the nanoscale.
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U2 - 10.1103/PhysRevLett.96.047206
DO - 10.1103/PhysRevLett.96.047206
M3 - Article
C2 - 16486886
AN - SCOPUS:33144464868
SN - 0031-9007
VL - 96
JO - Physical review letters
JF - Physical review letters
IS - 4
M1 - 047206
ER -