Abstract
We have investigated the normal-state resistance and the excess low-frequency (1/f) noise in 45°tilt [001] grain-boundary junctions in YBa2Cu3O7 thin films. A characteristic temperature dependence of the resistance fluctuations and a linear temperature dependence of the grain-boundary resistance (with a negative temperature coefficient) emerge as common features. These observations are quantitatively compared with a model of many, parallel conduction paths across the boundary, taking into account both temperature-independent and thermally activated transport processes.
Original language | English (US) |
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Pages (from-to) | 16164-16167 |
Number of pages | 4 |
Journal | Physical Review B |
Volume | 51 |
Issue number | 22 |
DOIs | |
State | Published - Jan 1 1995 |
ASJC Scopus subject areas
- Condensed Matter Physics